FYSS5455 Elektroni-, fotoni- ja ionisuihkumenetelmät materiaalitieteissä (5 op)

Opinnon taso:
Syventävät opinnot
Arviointiasteikko:
0-5
Suorituskieli:
englanti
Vastuuorganisaatio:
Fysiikan laitos
Opetussuunnitelmakaudet:
2020-2021, 2021-2022, 2022-2023

Kuvaus

  • Interaction of energetic ions, electrons and photons with matter
  • thin film deposition techniques
  • ion, electron and photon beam based characterization techniques for thin films and surfaces
  • project work, which consists of growth of thin films using atomic layer deposition, characterization of thin films using at least two different techniques, reporting performed analysis and presenting results in a seminar.

Osaamistavoitteet

After passing the course successfully the student

  • knows the most used thin film deposition techniques and applications of thin films

  • knows the basic interactions between photons, electrons and ions with matter

  • knows the different physical properties which can be probed using electron, photon and ion beam techniques

  • understands the underlying physics of different techniques

  • is able to choose the right characterization technique for each materials problem

  • can evaluate the quality of the results from own measurements but also from other studies

  • has hands-on experience of thin film deposition and characterization

  • can critically compare results obtained from same physical parameter by two different techniques

  • is able to do independent analysis of ion beam analysis data including the uncertainty budget

  • can write a brief report and give a presentation based on measured and simulated experimental data 

Esitietojen kuvaus

Preferably basic knowledge of nuclear and materials physics. 

Oppimateriaalit

Lecture slides, other material given during the course. 

Suoritustavat

Tapa 1

Kuvaus:
Given every other year.
Arviointiperusteet:
60 % oral exam, 20 % home excersises, 20 % project work.
Opetusajankohta:
Periodi 1
Valitaan kaikki merkityt osat
Suoritustapojen osat
x

Osallistuminen opetukseen (5 op)

Tyyppi:
Osallistuminen opetukseen
Arviointiasteikko:
0-5
Arviointiperusteet:
60 % oral exam, 20 % home excersises, 20 % project work.
Suorituskieli:
englanti
Työskentelytavat:
  • Lectures

  • Home excercises

  • Project work including sample preparation and analysis with at least two techniques

  • Lectures cover all the major materials characterization techniques in which photon, electron or ion beams are used

  • Oral exam 

Ei julkaistua opetusta