FYSS5456 Helium Ion Microscopy (1 cr)
Study level:
Advanced studies
Grading scale:
Pass - fail
Language:
English, Finnish
Responsible organisation:
Department of Physics
Curriculum periods:
2017-2018, 2018-2019, 2019-2020
Description
Content
The working principle of HIM; advantages of HIM compared to conventional SEM (resolution, ability to image non-conductive samples, material processing with neon beam); practical use of HIM; sample preparation of HIM.
Completion methods
Discussions and interactive events, demonstration, examination.
Assessment details
Participation on course events and demonstration is a requirement for grading. To pass the course students need to have a pass from the examination.
Learning outcomes
At the end of this course, students will be able to describe the working principle of helium ion microscopy (HIM) and conclude the advantages and disadvantages of HIM compared to other microscopy techniques. Students will be able to evaluate and justify the application of HIM to imaging of specific samples, such as biological samples and materials science and nanotechnology samples. They will have mastered the HIM principles and practice of tuning and using HIM for imaging to such extent that he/she can be trained to the use of the tool in a short time period.
Additional information
Given on autumn 2017, after which given when needed.
Literature
- David C. Joy, Helium Ion Microscopy – Principles and Applications, ISBN 978-1-4614-8659-6.; ISBN: 978-1-4614-8659-6
Completion methods
Method 1
Select all marked parts
Parts of the completion methods
x
Unpublished assessment item