RADS1001 Workshop: Basics of Radiation Environments and Challenges related to radiation effects (0–3 cr)

• Radiation Environments

• Radiation types

• Space

• Atmosphere

• Ground

• Radiation-Matter Interactions

• Electromagnetic radiation

• Photo-electric effect

• Compton Scattering

• Pair production

• Particle radiation

• Ionizing and non-ionizing interactions

• Electronic Stopping force

• Nuclear Stopping force

• Nuclear Reactions

• Tools

• Stopping

• Monte Carlo

• Radiation Effects in Electronic Materials

• Charge generation and recombination

• Linear Energy Transfer

• Ion Track Structure

• Straggling - Stochasticity in energy deposition

• Applicability of LET

• Non-ionizing energy loss (NIEL)

• Radiation Effects in Devices

• Cumulative effects

• Total Ionizing Dose (TID)

• Displacement Damage Dose (DDD)

• Single Event Effects

• Soft errors

• Hard errors

• Radiation Hardness Assurance (RHA) testing

• RHA Standards

• SEE testing principle

• Error Cross-section

• Error Bars

• Error Rate Prediction

• IRPP method

• RPP method

• Monte Carlo Method

• Test Facilities

• Heavy ions

• Protons

• High energy electrons

• Gamma rays and x-rays

• Neutrons 

On completion of the course, students will be able to:

• Evaluate the radiation effects sensitivity of tested devices in respect to basic radiation environments

• Analyze simple radiation hardness assurance test data

• Apply simple radiation effects test methodologies on memory components using radiation sources

• Understand the different effects ionizing and non-ionizing radiation have in electronic components

• Understand the radiation-induced charge generation and recombination in electronic materials and devices structures

• Understand the basics principles of radiation hardness assurance testing with different radiation types

• Remember different radiation environments in space, atmosphere and on ground level 

• Only for students of the RADMEP-programme

• Evaluation criteria: Approved written report with data analysis for the labwork (approval requires at least 70% of maximum points); Minimum of 50% of all given exercise questions, and simulation tasks completed successfully; Also including all the pretasks given for both labwork and the simulation sessions. 

Basic knowledge on operating principles of discrete electronic components, e.g MOSFETs and diodes