FYSS5456 Helium Ion Microscopy (1 cr)

Study level:
Advanced studies
Grading scale:
Pass - fail
Language:
English, Finnish
Responsible organisation:
Department of Physics
Curriculum periods:
2020-2021, 2021-2022, 2022-2023

Description

  • The working principle of HIM

  • advantages of HIM compared to conventional SEM (resolution, ability to image non-conductive samples, material processing with neon beam)

  • practical use of HIM

  • sample preparation for HIM. 

Learning outcomes

At the end of this course, student will be able to

  • describe the working principle of helium ion microscopy (HIM) and conclude the advantages and disadvantages of HIM compared to other microscopy techniques

  • evaluate and justify the application of HIM to imaging of specific samples, such as biological samples and materials science and nanotechnology samples

  • mastered the HIM principles and practice of tuning and using HIM for imaging to such extent that he/she can be trained to the use of the tool in a short time period. 

Study materials

Lecture notes 

Literature

  • David C. Joy, Helium Ion Microscopy – Principles and Applications, ISBN 978-1-4614-8659-6.

Completion methods

Method 1

Description:
Given when needed.
Evaluation criteria:
Passed exam (50 % of total points) and presence in laboratory demo and lectures.
Select all marked parts
Parts of the completion methods
x

Teaching (1 cr)

Type:
Participation in teaching
Grading scale:
Pass - fail
Evaluation criteria:
Passed exam (50 % of total points) and presence in laboratory demo and lectures.
Language:
English, Finnish
Study methods:
  • laboratory demo
  • exam
  • lectures (presence obligatory) 
No published teaching