FYSS5456 Helium Ion Microscopy (1 cr)
Study level:
Advanced studies
Grading scale:
Pass - fail
Language:
English, Finnish
Responsible organisation:
Department of Physics
Curriculum periods:
2020-2021, 2021-2022, 2022-2023
Description
The working principle of HIM
advantages of HIM compared to conventional SEM (resolution, ability to image non-conductive samples, material processing with neon beam)
practical use of HIM
sample preparation for HIM.
Learning outcomes
At the end of this course, student will be able to
describe the working principle of helium ion microscopy (HIM) and conclude the advantages and disadvantages of HIM compared to other microscopy techniques
evaluate and justify the application of HIM to imaging of specific samples, such as biological samples and materials science and nanotechnology samples
mastered the HIM principles and practice of tuning and using HIM for imaging to such extent that he/she can be trained to the use of the tool in a short time period.
Study materials
Lecture notes
Literature
- David C. Joy, Helium Ion Microscopy – Principles and Applications, ISBN 978-1-4614-8659-6.
Completion methods
Method 1
Description:
Given when needed.
Evaluation criteria:
Passed exam (50 % of total points) and presence in laboratory demo and lectures.
Select all marked parts
Parts of the completion methods
x
Teaching (1 cr)
Type:
Participation in teaching
Grading scale:
Pass - fail
Evaluation criteria:
Passed exam (50 % of total points) and presence in laboratory demo and lectures.
Language:
English, Finnish
Study methods:
- laboratory demo
- exam
- lectures (presence obligatory)