KEMS3250 Principles of X-ray diffraction methods (6 cr)

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Study level:
Advanced studies
Grading scale:
0-5
Language:
English, Finnish
Responsible organisation:
Department of Chemistry
Curriculum periods:
2017-2018, 2018-2019, 2019-2020

Description

Content

Course focuses on:
- X-ray radiation, crystal systems, Bravais lattices, symmetry operations and space group symmetries,
- measurement techniques, structure determination procedures, depicting methods and programs
- Course includes instrument demonstration and structure determination exercise

Completion methods

Exercises, instrument demonstration, and final exam at the end of the course

Assessment details

Exercise and final exam at the end of the course,
or book exam.

Final exam with a maximum of 24 points. Lowest passed grade (1/5) requires 50% of the points.

Learning outcomes

After successfully completing the course, the student:
- understands basic principles of X-ray crystallography, and knows in the basic level how to apply them for characterizing crystalline materials with single crystal diffraction method.
- Understands common practices in X-ray diffractometry and is aware of sample and instrumentation related parameters effecting to analysis.

Additional information

The course is lectured every year in the third period.

Description of prerequisites

Subject studies in chemistry

Study materials

lecture material and relevant literature
General exam material: lecture material + text book (Werner Massa, Crystal structure determination, Springer-Verlag Berlin Heidelberg, Germany, 2000)

Completion methods

Method 1

Select all marked parts

Method 2

Select all marked parts
Parts of the completion methods
x

Teaching (6 cr)

Type:
Participation in teaching
Grading scale:
0-5
Language:
English, Finnish

Teaching

x

Exam (6 cr)

Type:
Exam
Grading scale:
0-5
Language:
English, Finnish

Teaching